Time and Frequency from A to Z, Ch to Cy | NIST
NIST has published a comprehensive guide covering various aspects of timekeeping and frequency measurement standards. The document defines key…
Electron Beam Ion Trap (EBIT) | NIST
The National Institute of Standards and Technology (NIST) has developed an advanced research tool called the Electron Beam Ion Trap (EBIT).…
Electron-Ion Collisions | NIST
This article discusses research conducted at NIST using an Electron Beam Ion Trap (EBIT) to study highly charged ions and their interactions.…
Atomic Reference Data for Electronic Structure Calculations, Electronic Configurations of the Elements | NIST
The article discusses the electronic configurations of neutral elements and their first cations from hydrogen to uranium. The data is sourced…
Visible and UV Spectroscopy | NIST
This article discusses research conducted at NIST using an Electron Beam Ion Trap (EBIT) to study highly charged ions. The EBIT allows for…
Methane Symmetry Operations – Quantum Mechanical Operators | NIST
This article discusses the application of group theory and symmetry operations to the quantum mechanical treatment of methane molecules. The…
NIST TN 1297: 4. Type B Evaluation of Standard Uncertainty | NIST
NIST TN 1297: 4. Type B Evaluation of Standard Uncertainty The National Institute of Standards and Technology (NIST) has published a technical…
Index of Semiconductor Process Gases – Argon | NIST
The National Institute of Standards and Technology (NIST) has released a comprehensive database of thermophysical properties for argon gas, an…
Index of Semiconductor Process Gases – Hexafluoroethane | NIST
Summary of Hexafluoroethane Thermophysical Properties Database The National Institute of Standards and Technology (NIST) has released a…