Enabling Technologies and Quantum Devices News Quantum Sensing and Metrology1 Min Read homerpaponSeptember 10, 2024 James K. Olthoff | NIST James K. Olthoff, a distinguished physicist with over 35 years of experience at NIST, has been appointed as the organization’s first…
Enabling Technologies and Quantum Devices News Quantum Computing and Algorithms1 Min Read homerpaponSeptember 9, 2024 AJ Rasmusson | NIST Title: NIST Postdoctoral Researcher AJ Rasmusson’s Work on Trapped-Ion Quantum Hardware Summary: AJ Rasmusson, a National Research…
Enabling Technologies and Quantum Devices News Quantum Communication and Networks Quantum Computing and Algorithms1 Min Read homerpaponSeptember 9, 2024 Quantum Networks at NIST: Glossary | NIST This article from NIST provides a comprehensive glossary of terms related to quantum networks and quantum communication technologies. Key…
Enabling Technologies and Quantum Devices News Quantum Computing and Algorithms Quantum Sensing and Metrology1 Min Read homerpaponSeptember 6, 2024 Calibration Services in the Time and Frequency Division | NIST NIST Offers Comprehensive Time and Frequency Calibration Services NIST provides a wide range of fee-based calibration services for customers…
Enabling Technologies and Quantum Devices News Quantum Computing and Algorithms Quantum Sensing and Metrology1 Min Read homerpaponSeptember 5, 2024 Optical Probes of 2D Magnetic Phenomena | NIST Researchers at NIST have developed advanced optical techniques to study and control magnetic phenomena in 2D materials, which could lead to…
Enabling Technologies and Quantum Devices News Quantum Computing and Algorithms Quantum Sensing and Metrology1 Min Read homerpaponSeptember 4, 2024 Quantum Bioimaging | NIST Title: NIST Develops Quantum Bioimaging Tools Using Entangled Photons The National Institute of Standards and Technology (NIST) has developed…
Enabling Technologies and Quantum Devices News Quantum Sensing and Metrology1 Min Read homerpaponSeptember 3, 2024 Non-Destructive Semiconductor Structure Function and Process Optimization for future Microelectronics Manufacturing at the NIST NSLS-II Beamline for XAFS and Diffraction | NIST NIST is enhancing its synchrotron beamline for advanced semiconductor material characterization. The upgrades will improve X-ray diffraction…
Enabling Technologies and Quantum Devices News Quantum Sensing and Metrology1 Min Read homerpaponSeptember 3, 2024 Dynamic EUV Metrology of Nanoscopic Thermal Transport in Active Devices | NIST Title: NIST Develops Advanced EUV Metrology for Nanoscale Thermal Transport Measurement The National Institute of Standards and Technology…
Enabling Technologies and Quantum Devices News Quantum Sensing and Metrology1 Min Read homerpaponSeptember 3, 2024 EUV Scatterometry | NIST The article discusses the development of advanced scatterometry techniques for measuring and inspecting the smallest features on integrated…