1 Min Read onFebruary 3, 2025 Spotlight: A Stability-Boosting Swap for Our Chip-Scale Clock | NIST Title: NIST Develops More Stable Chip-Scale Atomic Clock Using Near-Infrared Laser Summary: Researchers at the National Institute of Standards…
1 Min Read onFebruary 3, 2025 JILA Team Finds First Direct Evidence of ‘Spin Symmetry’ In Atoms | NIST JILA physicists have made the first direct observation of spin symmetry in atoms, a key prediction of quantum physics. The team, led by Ana…
1 Min Read onFebruary 3, 2025 Five NIST Scientists Win Flemming Awards | NIST Five NIST researchers have been recognized with prestigious 2009 Arthur S. Flemming Awards for their groundbreaking work in various fields.…
1 Min Read onFebruary 3, 2025 NIST Physicists Demonstrate Quantum Entanglement in Mechanical System | NIST NIST physicists have demonstrated quantum entanglement in a mechanical system for the first time, using two pairs of vibrating ions. Each pair…
1 Min Read onFebruary 3, 2025 NIST’s Compact Gyroscope May Turn Heads | NIST NIST researchers have developed a compact atomic gyroscope that could revolutionize navigation technology. The device, which measures just 3.5…
1 Min Read onFebruary 3, 2025 Announcement of Proposal to Revise Special Publication 800-22 Revision 1a | NIST NIST Proposes Revisions to Cryptographic Test Suite The National Institute of Standards and Technology (NIST) has initiated a review process…
1 Min Read onFebruary 3, 2025 Spotlight: Into the Postdoc Process With NIST’s Jake Davidson | NIST Title: Navigating the NRC Research Associateship Program for a Quantum Computing Postdoc at NIST Summary: NIST postdoctoral researcher Jacob…
1 Min Read onFebruary 3, 2025 NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips | NIST NIST has developed a new “hybrid metrology” method that combines multiple measurement techniques to more accurately measure tiny…
1 Min Read onFebruary 3, 2025 NIST, Collaborators Develop Sensitive New Way of Detecting Transistor Defects | NIST Researchers at NIST and collaborators have developed a new method to detect and count defects in transistors, which are crucial for…