Ralph A. Richter | NIST
Ralph A. Richter is a highly experienced professional engineer with over 35 years of federal service, specializing in the development of…
Structure, Defects, and Scattering in Graphene | NIST
Researchers at NIST are studying the properties of graphene, a single layer of carbon atoms with unique electronic properties, to understand…
Bill Newhouse | NIST
Bill Newhouse is a cybersecurity engineer at NIST’s National Cybersecurity Center of Excellence (NCCoE). He leads projects on data…
Nanomechanical Properties Group | NIST
The Nanomechanical Properties Group at NIST’s Materials Measurement Laboratory focuses on developing measurement science, standards, and…
DUV/EUV Nanoscopy for Imaging Nanostructures | NIST
The National Institute of Standards and Technology (NIST) is developing advanced microscopy techniques using deep ultraviolet (DUV) and…
Emerging Hardware for Artificial Intelligence | NIST
NIST researchers are exploring new approaches to artificial intelligence (AI) by designing AI systems from the hardware level, rather than…
Spintronics for Neuromorphic Computing | NIST
The article discusses the potential of spintronics, specifically magnetic tunnel junctions (MTJs), for neuromorphic computing. MTJs are…
GaN Nanowire Metrology and Applications | NIST
NIST researchers have developed advanced metrology techniques using gallium nitride (GaN) nanowires for semiconductor characterization and…
Optical Methods for 3-D Nanostructure Metrology (Archived) | NIST
NIST Develops Advanced Optical Metrology for Nanoscale Manufacturing The National Institute of Standards and Technology (NIST) has developed…