Optical Probes of 2D Magnetic Phenomena | NIST
Researchers at NIST have developed advanced optical techniques to study and control magnetic phenomena in 2D materials, which could lead to…
Cryptography | NIST
NIST has been a leader in cryptography for 50 years, developing standards and guidelines that enable secure data exchange. Their work has…
Quantum Bioimaging | NIST
Title: NIST Develops Quantum Bioimaging Tools Using Entangled Photons The National Institute of Standards and Technology (NIST) has developed…
Atomic Reference Data for Electronic Structure Calculations, Results | NIST
Here is a concise summary of the NIST article on atomic reference data for electronic structure calculations: Title: NIST Releases Atomic…
Metrology of Materials, Surfaces, and Processes for Hybrid Advanced Packaging | NIST
The article discusses NIST’s research into metrology for advanced hybrid packaging bonding processes. The project aims to develop…
Non-Destructive Semiconductor Structure Function and Process Optimization for future Microelectronics Manufacturing at the NIST NSLS-II Beamline for XAFS and Diffraction | NIST
NIST is enhancing its synchrotron beamline for advanced semiconductor material characterization. The upgrades will improve X-ray diffraction…
Electron-Solid Interactions | NIST
The article discusses the importance of understanding electron-solid interactions for accurate interpretation of scanning electron microscopy…
RF Metrology for High-Frequency Transistor Models | NIST
NIST is working on a project to improve high-frequency transistor modeling and characterization for US semiconductor companies. The project…
Strain Measurement for Semiconductor Devices and Packages | NIST
Title: NIST Advances Strain Measurement Techniques for Semiconductor Devices The National Institute of Standards and Technology (NIST) has…