Machine Learning Driven Self-correcting Autonomous Metrology Systems (SAMS) | NIST
NIST is developing machine learning-driven autonomous metrology systems as part of their NIST-on-a-Chip program. These systems aim to remove…
Photonic Dosimetry | NIST
NIST is developing a new type of chip-based sensor for measuring ionizing radiation doses at very small scales, as part of its NIST on a Chip…
Electron Reflectometer and Process for Performing Shape Metrology | NIST
A new electron reflectometer has been developed that allows for precise measurement of nanoscale dimensions in three dimensions at a surface…
Direct Absolute Spectrometer for Direct Absolute Spectrometry | NIST
NIST has developed a new spectrometer technology that precisely characterizes the spectral properties of single-photon light sources using an…
Fast Entangled State Generation and Quantum Information Transfer in a Quantum System with Long-Range Interactions | NIST
NIST researchers have developed a new protocol that significantly speeds up quantum information transfer and entangled state generation in…
High Efficiency Photon Detection | NIST
The article discusses a new high-efficiency photon detection technology developed by NIST. The key innovation is a detection pixel design that…
Metasurface Optical Pulse Shaper for Shaping an Optical Pulse in a Temporal Domain | NIST
NIST Develops Advanced Optical Pulse Shaping Technology The National Institute of Standards and Technology (NIST) has developed a new…
Optical Time Distributor and Process for Optical Two-Way Time-Frequency Transfer | NIST
NIST has developed an optical time distributor that uses frequency combs to synchronize clocks across free space links, including open air…
Neural Member, Neural Network, and Neurological Memory | NIST
The article discusses a new artificial synapse technology based on superconducting Josephson junctions with magnetic clusters. This technology…