Chip-Scale Sensor Invention with Vast Applications: Maximizing Transfer to Industry | NIST
NIST Recognizes Dr. John Kitching for Advancing Miniature Atomic Sensor Technology The National Institute of Standards and Technology (NIST)…
2013 NAI Fellow – Dave Wineland | NIST
Summary: David J. Wineland, a physicist at NIST Boulder Laboratories in Colorado, has been named a 2013 NAI Fellow for his significant…
2011 Arthur S. Flemming Award – Till Rosenband | NIST
The Arthur S. Flemming Award is given to recognize outstanding federal service and achievement. In 2011, Till Rosenband received this…
Magnetic Resonance Spectroscopy | NIST
The National Institute of Standards and Technology (NIST) is conducting research to better understand the role of atomic-scale defects in…
Agenda | NIST
The 19th International Workshop on Low Temperature Detectors (LTD-19) is a major scientific conference focused on the development and…
Having a Robust Quality Management System is More Than Just a Certificate on the Wall. For XMA Corporation it Produced a Solid Company Culture | NIST
XMA Corporation, a global leader in RF and microwave components, implemented a robust Quality Management System (QMS) to strengthen its…
Posters | NIST
This article presents a collection of research papers and developments in various areas of optical metrology and radiometry, highlighting…
Moneer Helu is Recognized as an Outstanding, Early-Career Engineer | NIST
The German-American Frontiers of Engineering (GAFOE) symposium will be held virtually from March 17-19, 2021, bringing together 60 of the most…
Standards and Technical Committees | NIST
The article discusses the involvement of Lawrence Livermore National Laboratory (LLNL) staff in various technical committees and standards…