Basic Metrology: Remote Sensing Methods for Imaging Dose to Water | NIST
Title: NIST Develops Advanced Remote Sensing Methods for Accurate Radiation Dose Measurement Summary: The National Institute of Standards and…
Interferometry: Precision Scattering Length Measurements of Low-Z Isotopes using Neutron Interferometry | NIST
Researchers at NIST have made precise measurements of the neutron scattering length for helium-4 using neutron interferometry. The scattering…
Interferometry: Neutron Interferometry with Polarized Neutrons as an Additional Degree of Freedom | NIST
Researchers at NIST have developed a new method to improve the performance of neutron interferometers using quantum information processing…
Interferometry: Quantum Error Coding in a 4-Blade Neutron Interferometer | NIST
Researchers at the University of Waterloo have developed a new type of neutron interferometer that is less sensitive to low-frequency…
Precision Materials for Quantum Devices | NIST
Researchers at NIST have developed advanced fabrication techniques for quantum devices using ultra-high vacuum (UHV) systems. Key findings…
Fundamental Physics: Electric Field Imaging with Neutrons | NIST
Researchers at NIST and Sandia National Laboratories have successfully imaged an isolated electric field using neutrons for the first time.…
Optical scattering from surfaces | NIST
NIST Researches Optical Scattering from Surfaces The National Institute of Standards and Technology (NIST) is conducting research on optical…
Optical Polarization Metrology | NIST
Title: NIST Develops Advanced Optical Polarization Metrology Techniques NIST researchers are developing new methods for measuring and…
Enriched Silicon and Devices for Quantum Information | NIST
NIST researchers have developed a novel method for growing ultra-enriched 28Si epilayers on natural abundance silicon substrates, enabling the…