Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM) | NIST
The article discusses the use of a Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM) at NIST in Boulder, Colorado. This…
Quantum Conductance | NIST
NIST researchers have developed advanced graphene-based quantum Hall effect (QHE) devices that significantly improve electrical resistance…
Metrology of the Ohm | NIST
The Metrology of the Ohm Project at NIST focuses on developing and maintaining resistance and current measurement standards. Key points: 1.…
Basic Metrology: High-Dose Dosimetry Uncertainty Tables | NIST
Title: NIST Releases High-Dose Dosimetry Uncertainty Tables The National Institute of Standards and Technology (NIST) has published detailed…
Comparison: Co-60 Absorbed Dose for High-Dose Dosimetry | NIST
The National Institute of Standards and Technology (NIST) participated in an international comparison of standards for absorbed dose to water…
Comparisons: Key Comparison for Air-Kerma From Therapy Level and Radiation Protection Gamma-ray Beams | NIST
NIST and BIPM Complete Key Comparisons for Air Kerma Standards The National Institute of Standards and Technology (NIST) and the Bureau…
Kilogram: The Present | NIST
The article explains how the kilogram, once defined by a physical artifact known as the International Prototype Kilogram (IPK), was redefined…
Small Mass and Small Force Metrology at NIST | NIST
NIST is developing advanced metrology techniques for small mass and force measurements, building on the redefinition of the SI units. The…
2009 – Bronze Medal Award—Alan Migdall | NIST
In 2009, Alan Migdall received the Department of Commerce Bronze Medal Award from NIST for his significant contributions to photon-based…