CHRNS MACS | NIST
The article discusses the polarized beam capability of the new MACS (Multi-Axis Crystal Spectrometer) instrument at the NIST Center for…
Atom Manipulation with the Scanning Tunneling Microscope | NIST
Researchers at NIST have developed advanced techniques using scanning tunneling microscopes (STMs) to manipulate individual atoms with atomic…
Structure and Dynamics of Superconducting NaxCoO2 Hydrate and Its Unhydrated Analog | NIST
This article discusses the discovery of a new class of “high-TC” superconductors in the NaxCoO2 system, which could potentially…
Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials | NIST
Researchers at NIST are developing advanced optical spectroscopy techniques to study ultrafast dynamics in nanoscale materials. Their work…
Tom O’Brian, Our Inspiration and Champion | NIST
Tom O’Brien, a dedicated leader at NIST, passed away after a 29-year career. He held various leadership positions, including director of…
1980s | NIST
In 1983, NIST redefined the meter based on the speed of light, marking a major advancement in measurement standards. This was made possible by…