Legal Metrology: Maintaining Our Trust in Measurements | NIST
The article discusses the importance of legal metrology in maintaining measurement accuracy and trust in the United States. Legal metrology…
NIST Brings Mass Measurement to the Masses | NIST
NIST has delivered a portable tabletop Kibble balance to the U.S. Army, marking the first time this superaccurate mass measurement technology…
NIST Demonstrates a New ‘Primary Standard’ for Measuring Ultralow Pressures | NIST
NIST has developed a new “primary standard” for measuring extremely low gas pressures called CAVS (cold atom vacuum standard).…
NIST-Designed Photonic Chip Transforms a Single Beam of Light Into Multiple Beams, Each With a Panoply of Different Properties | NIST
NIST researchers have developed a photonic chip that can transform a single incoming laser beam into multiple beams with different properties.…
Just for KICS! | NIST
Researchers at NIST have developed a new system to read out measurements from single-photon detectors using kinetic inductance current sensors…
Shrinking Technology, Expanding Horizons: Compact Chips Advance Precision Timing for Communications, Navigation and Other Applications | NIST
NIST researchers have developed compact chips that convert light into microwaves, potentially revolutionizing timing technology for various…
NIST Delivers Report on American Competitiveness in Critical High-Tech Industries | NIST
The National Institute of Standards and Technology (NIST) has delivered a report to Congress analyzing the current state and future potential…
OWM Recognizes Contributions of Proficiency Testing Coordinators at RMAPs | NIST
The NIST OWM Laboratory Metrology program recently recognized the contributions of Proficiency Testing (PT) Coordinators at the RMAP meetings.…
Do the Bump: NIST Scientists Perfect Miniaturized Technique to Generate Precise Wavelengths of Visible Laser Light | NIST
Researchers at NIST and JQI have developed a miniaturized technique to generate precise wavelengths of visible light using optical parametric…