Quantum Sensing and Metrology

1 Min Read

onFebruary 3, 2025

Researchers Validate Simplified Lateral Force Calibration Technique for Atomic Force Microscopy | NIST

Researchers from NIST have validated a simpler method for calibrating lateral sensitivity in atomic force microscopes (AFMs) that agrees with…

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onFebruary 3, 2025

Researchers at NIST have made progress in creating “molecules” of light, a significant step towards building complex structures…

1 Min Read

onFebruary 3, 2025

Researchers at NIST have developed a new method for growing well-aligned semiconductor nanowires using gold nanoparticles as anchors. The…

1 Min Read

onFebruary 3, 2025

NIST Recognizes 64 Staff Members for Quantum and Other Advancements The National Institute of Standards and Technology (NIST) has honored 64…

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onFebruary 3, 2025

NIST researchers have developed a new type of Josephson junction that could significantly increase the speed and density of superconducting…

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onFebruary 3, 2025

NIST and University at Albany’s CNSE Partner on Nanoscale Measurement and Standards The National Institute of Standards and Technology…

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onFebruary 3, 2025

A team of physicists from the United States and Russia has developed a new method for calculating a tiny, temperature-dependent source of…

2 Min Read

onFebruary 3, 2025

NIST Fellow William D. Phillips, known for his groundbreaking work in laser cooling of atoms, has been elected to the National Academy of…

1 Min Read

onFebruary 3, 2025

NIST has released a new standard reference material (SRM) 3461 for calibrating atomic force microscopy (AFM) cantilevers. The SRM contains…