NIST is developing specialized scanning probe metrology protocols to measure how electrons behave at the atomic scale. Rather than a formal industry standard, these are advanced measurement methods that use the quantum properties of electrons themselves as probes. The work is currently in active development, relying on custom instruments that operate near absolute zero temperature and under strong magnetic fields. This extreme environment allows researchers to track individual electrons with pinpoint accuracy, combining high-resolution imaging with on-site material fabrication to advance four key areas: improving measurement tools, studying exotic materials like graphene, designing custom quantum structures, and using electron spin for high-precision sensing.
By enabling precise observation and control of quantum phenomena at the smallest scales, these protocols will accelerate the development of reliable quantum sensors, advanced materials, and next-generation quantum computing components. While no specific implementation timeline has been announced, NIST’s ongoing research is steadily integrating these methods into broader quantum technology workflows. As the techniques mature, they are expected to become foundational measurement practices that help ensure consistency, accuracy, and performance across emerging quantum devices.
Keywords: scanning probe microscopy, quantum tunneling, topological materials
