Nanostructure Fabrication and Metrology | NIST

Title: NIST Develops Advanced Photon Counting Technology for Quantum Metrology

Key Points:
– NIST is developing true photon counters (photon number-resolving detectors) for quantum optical metrology
– Semiconductor nanostructures, particularly quantum dots and photonic crystals, are being used to create single photon sources and detectors
– Quantum dot sources offer advantages in wavelength control, emission speed, and integration with high-Q cavities
– NIST has demonstrated wavelength bistability and “dark pulse” lasers using quantum dot technology

Impact:
– Enables precise measurement of quantum states of light
– Advances quantum communications and optical power traceability
– Potential for new measurement methodologies in the next decade

Implementation:
– Current status: Research and development
– Timeframe: Next decade for new measurement methodologies
– Collaboration with Quantum Information and Terahertz Technology Project and JILA

Source: https://www.nist.gov/programs-projects/nanostructure-fabrication-and-metrology

Keywords: Photon, Quantum, Metrology, Entangled, Quantum dot

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